| 论文编号: | 1725110120160213 |
| 论文题目: | Surface potential measurement on contact resistance of amorphous-InGaZnO thin film transistors by Kelvin probe force microscopy |
| 作者: | 韩志恒 |
| 刊物名称: | Applied Physics Letters |
| 年: | 2016 |
| 期: | 109 |
| 页: | 023509-1 |
| 联系作者: | 李泠 |
| 论文编号: | 1725110120160213 |
| 论文题目: | Surface potential measurement on contact resistance of amorphous-InGaZnO thin film transistors by Kelvin probe force microscopy |
| 作者: | 韩志恒 |
| 刊物名称: | Applied Physics Letters |
| 年: | 2016 |
| 期: | 109 |
| 页: | 023509-1 |
| 联系作者: | 李泠 |
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