| 论文编号: | 1725110120160276 |
| 论文题目: | Random telegraph noise: the key to single defect studies in nano-devices |
| 作者: | Eddy Simoen |
| 刊物名称: | Thin Solid Films |
| 年: | 2016 |
| 期: | 613 |
| 页: | 2 |
| 联系作者: | Eddy Simoen |
| 论文编号: | 1725110120160276 |
| 论文题目: | Random telegraph noise: the key to single defect studies in nano-devices |
| 作者: | Eddy Simoen |
| 刊物名称: | Thin Solid Films |
| 年: | 2016 |
| 期: | 613 |
| 页: | 2 |
| 联系作者: | Eddy Simoen |
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