| 论文编号: | 1725110120160288 |
| 论文题目: | Experimental Study of Single Event Upset and Single Event Latch-up in SOI SRAM |
| 作者: | 王林飞 |
| 刊物名称: | International Conference on Solid-State and Integrated Circuit Technology (ICSICT) |
| 年: | 2016 |
| 期: | 4 |
| 页: | 12 |
| 联系作者: | 罗家俊 |
| 论文编号: | 1725110120160288 |
| 论文题目: | Experimental Study of Single Event Upset and Single Event Latch-up in SOI SRAM |
| 作者: | 王林飞 |
| 刊物名称: | International Conference on Solid-State and Integrated Circuit Technology (ICSICT) |
| 年: | 2016 |
| 期: | 4 |
| 页: | 12 |
| 联系作者: | 罗家俊 |
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