论文编号: 1725110120160338
论文题目: Ultra-thin 20 nm-PECVD-Si3N4 surface passivation in T-shaped gate InAlAs/InGaAs InP-based HEMTs and its impact on DC and RF performance
作者: 丁芃
刊物名称: SOLID-STATE ELECTRONICS
: 2016
: 123
: 1
联系作者: 金智