人工智能EDA，集成电路可靠性

国家级海外青年人才项目，项目负责人，2025.01–2027.12

Sun, Zeyu; Tong, Weijie; Ma, Xiaoning; Cao, He; Liu, Jianyun; Li, Zhiqiang; Xu, Qinzhi;

ChipletEM: Physics-Based 2.5D and 3D Chiplet Heterogeneous Integration Electromigration Signoff Tool Using Coupled Stress and Thermal Simulation, Design Automaiton Conference, San Fransico US, 2025-06-23至2025-06-26

 Zeyu Sun; Shuyuan Yu; Han Zhou; Yibo Liu; Sheldon X.-D.Tan; EMSpice: Physics-Based

Electromigration Check Using Coupled Electronic and Stress Simulation, IEEE Transactions on  Device and Materials Reliability, 2020, 20(2): 376-389

 Zeyu Sun; Sheriff Sadiqbatcha; Hengyang Zhao; Sheldon X.-D. Tan; Saturation-Volume

Estimation for Multisegment Copper Interconnect Wires, IEEE Transactions on Very Large Scale

Integration (VLSI) Systems, 2019, 27(7): 1666-1674

 Zeyu Sun; Ertugrul Demircan; Mehul D. Shroff; Chase Cook; Sheldon X.-D. Tan; Fast

Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires, IEEE

Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018, 37(12): 3137-3150

 Zeyu Sun; Sheriff Sadiqbatcha; Hengyang Zhao; Sheldon X.-D.Tan ; Accelerating

electromigration aging for fast failure detection for nanometer ICs, 2018 23rd Asia and South

Pac

Zeyu Sun; Ertugrul Demircan; Mehul D.Shrof; Taeyoung Kim; Xin Huang; Sheldon X.-D.Tan ;

Voltage-based electromigration immortality check for general multi-branch interconnects,

Proceedings of the 35th International Conference on Computer-Aided Design, Austin, TX, USA

 Zeyu Sun; Han Zhou; Sheldon X.-D. Tan ; Dynamic Reliability Management for Multi-Core

Processor Based on Deep Reinforcement Learning, 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Lausanne, Switzerland

 Zeyu Sun; Taeyoung Kim; Marcus Chow; Shaoyi Peng; Han Zhou; Hyoseung Kim; Daniel Wong;

Sheldon X.-D.Tan ; Long-Term Reliability Management For Multitasking GPGPUs, 2019 16th

International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Lausanne, Switzerland,

专著：

 Sheldon Tan; Mehdi Tahoori; Taeyoung Kim; Shengcheng Wang; Zeyu Sun; Saman Kiamehr; Long Term Reliability of Nanometer VLSI Systems, Springer Nature Switzerland AG, 2019 (学术专著) 

埋入式电源轨的电迁移应力建模方法和装置, 2025-12-22, 中国, 2025119370348 

国家海外高层次人才引进计划入选者